KUKLIN, Vladimir Zh.; IVANOV, Naur Z.; MURANOV, Alexander N.; ALEXANDROV, Islam A.; LINSKAYA, Elena Yu. Improving the Reliability of Biometric Authentication Processes Using a Model for Reducing Data Drift. Emerging Science Journal, [S. l.], v. 8, n. 6, p. 2449–2464, 2024. DOI: 10.28991/ESJ-2024-08-06-018. Disponível em: https://www.ijournalse.org/index.php/ESJ/article/view/2824. Acesso em: 21 jun. 2025.