JAHANIRAD, Hadi; KARAM, Hanieh. BIST-based Testing and Diagnosis of LUTs in SRAM-based FPGAs. Emerging Science Journal, [S. l.], v. 1, n. 4, p. 216–225, 2017. DOI: 10.28991/ijse-01125. Disponível em: https://www.ijournalse.org/index.php/ESJ/article/view/54. Acesso em: 6 jun. 2025.