Kuklin VZ, Ivanov NZ, Muranov AN, Alexandrov IA, Linskaya EY. Improving the Reliability of Biometric Authentication Processes Using a Model for Reducing Data Drift. Emerg Sci J [Internet]. 2024 Dec. 1 [cited 2025 Jun. 21];8(6):2449-64. Available from: https://www.ijournalse.org/index.php/ESJ/article/view/2824